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MarSurf CD 140輪廓測量儀

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更新時間:2018-01-11 11:42:32瀏覽次數:1034

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The new MarSurf CD series from Mahr sets new standards when it comes to contour testing.

詳細介紹

銷售:鐘       

MarSurf CD 140 / 280 Contour measuring station、MarSurf CD 140 / 280 Contour measuring station、MarSurf CD 140 / 280 Contour measuring station

Contour measuring in a new dimension

The new MarSurf CD series from Mahr sets new standards when it comes to contour testing. With the new MarSurf CD series, manufacturing companies are entering a new dimension in order to reliably secure and improve the manufacturing quality of workpieces in the measuring room or close to production.

The new measuring station concept combines speed, safety and flexibility. The aim is to increase the profitability of the system for your company.

 

Innovative Technologies:

Fast axes

  • Positioning Speeds up to 200 mm/s in X
  • 25x faster than the predecessors MarSurf PCV and MarSurf CD 120
  • All measuring stations of this series have a fully CNC-capable Z-axis
  • The Z-axis is approx. twice as fast as previous Mahr Z-axes
  • Up to 5x faster than the X-axes usually found on the market

Highly dynamic, inligent probe system

  • Probe arm recognition via integrated chip
  • Standard measuring range up to 70 mm; max. 100 mm with 490 mm probe arms
  • Magnetic probe arm mount, probe arm change without tools
  • The probe system combines robustness with dynamics
  • Optional: Expansion for roughness Evaluation
     

Innovative workpiece clamping system

  • Mounting plate 390 x 430 mm with bore size 50 mm
  • Integrated 60 mm TY adjustment
  • The combination of mounting plate and integrated TY adjustment omits the needs for an additional XY table
  • Low workpiece set-up leads to an advantageously short measuring circuit, which positively affects the measuring results
  • 技術數據
  • 應用
  • 版本

 

 

6269004 - MarSurf CD 280 BG 11

6269000 - MarSurf CD 140 BG 11

測桿長度

210 mm; 350 mm; 490 mm

210 mm; 350 mm; 490 mm

測量速度(文本)

0.1-10 mm/s

0.1-10 mm/s

掃描長度末尾(X 方向)

280 mm

140 mm

分辨率

max. 6 nm (with 210 mm probe arm)

max. 6 nm (with 210 mm probe arm)

掃描長度開始(X 方向)

0.1 mm

0.1 mm

定位速度(文本)

0.1-200mm/s

0.1-200mm/s

導塊偏差

0,125 µm / 60 mm
0,3 µm / 140 mm
0,45 µm / 280 mm

0,125 µm / 60 mm

0,3 µm / 140 mm

測量范圍 mm

70 mm (in Z with 350 mm probe arm)

max. 100 mm (with 490 mm probe arm)

70 mm (in Z with 350 mm probe arm)

max. 100 mm (with 490 mm probe arm)

測量力 (N)

4 mN to 30 mN, in Z+ and Z-, adjustable via software

4 mN to 30 mN, in Z+ and Z-, adjustable via software

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